タイトル：An approach to test scheduling for asynchronous on-chip interconnects using integer programming
著者: Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko
雑誌名：Digest of Papers 11th IEEE Workshop on RTL and High Level Testing (WRTLT '10)
ページ: 69-74
発行月: 12
発行年: 2010
タイプ: inproceedings
