タイトル：Test scheduling algorithms for delay-insensitive chip area interconnects based on cone partitioning
著者: Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko
雑誌名：Proc. 3rd International Workshop on the Impact of Low-Power Design on Test and Reliability (LPonTR '10)
ページ: 1-2
発行月: 5
発行年: 2010
タイプ: inproceedings
