Title：Test scheduling algorithms for delay-insensitive chip area interconnects based on cone partitioning
Authors: Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko
Jounrnals：Proc. 3rd International Workshop on the Impact of Low-Power Design on Test and Reliability (LPonTR '10)
Pages: 1-2
Published Month: 5
Published Year: 2010
Type: inproceedings
