Title:Efficient path delay test generation based on stuck-at test generation using checker circuitry
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Mineo Kaneko, Hideo Fujiwara
Jounrnals:Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD '07)
Pages: 418-423
Published Month: 11
Published Year: 2007
Type: inproceedings
Reference: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04397301