Title:Efficient path delay test generation based on stuck-at test generation using checker circuitry

Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Mineo Kaneko, Hideo Fujiwara

Jounrnals:Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD '07)

Pages: 418-423

Published Month: 11

Published Year: 2007

Type: inproceedings

Reference: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04397301