Title：A new test generation model for broadside transition testing of partial scan circuits
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：Proc. 14th IFIP/IEEE/ACM International Conference on Very Large Scale Integration (VLSI-SoC '06)
Pages: 308-313
Published Month: 10
Published Year: 2006
Type: inproceedings
Reference: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04107648
