タイトル:A low power deterministic test using scan chain disable technique

著者: Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara

雑誌名:Digest of Papers 6th IEEE Workshop on RTL and High Level Testing (WRTLT '05)

ページ: 184-191

発行月: 7

発行年: 2005

タイプ: inproceedings