Title:A low power deterministic test using scan chain disable technique

Authors: Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara

Jounrnals:Digest of Papers 6th IEEE Workshop on RTL and High Level Testing (WRTLT '05)

Pages: 184-191

Published Month: 7

Published Year: 2005

Type: inproceedings