Title:A low power deterministic test using scan chain disable technique
Authors: Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara
Jounrnals:Digest of Papers 6th IEEE Workshop on RTL and High Level Testing (WRTLT '05)
Pages: 184-191
Published Month: 7
Published Year: 2005
Type: inproceedings