Title：Acceleration of transition test generation for acyclic sequential circuits utilizing constrained combinational stuck-at test generation
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：Proc. 10th IEEE European Test Symposium (ETS '05)
Pages: 48-53
Published Month: 5
Published Year: 2005
Type: inproceedings
Reference: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1430008
