タイトル:An approach to non-scan design for delay fault testability of controllers

著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara

雑誌名:Digest of Papers 4th IEEE Workshop on RTL and High Level Testing (WRTLT '03)

ページ: 79-85

発行月: 11

発行年: 2003

タイプ: inproceedings