タイトル：An approach to non-scan design for delay fault testability of controllers
著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
雑誌名：Digest of Papers 4th IEEE Workshop on RTL and High Level Testing (WRTLT '03)
ページ: 79-85
発行月: 11
発行年: 2003
タイプ: inproceedings
