Title：An approach to non-scan design for delay fault testability of controllers
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：Digest of Papers 4th IEEE Workshop on RTL and High Level Testing (WRTLT '03)
Pages: 79-85
Published Month: 11
Published Year: 2003
Type: inproceedings
