タイトル：Reducibility of sequential test generation to combinational test generation for several delay fault models
著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
雑誌名：Proc. 12th IEEE Asian Test Symposium (ATS '03)
ページ: 58-63
発行月: 11
発行年: 2003
タイプ: inproceedings
リファレンス: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1250783&userType=inst
