Title：Reducibility of sequential test generation to combinational test generation for several delay fault models
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：Proc. 12th IEEE Asian Test Symposium (ATS '03)
Pages: 58-63
Published Month: 11
Published Year: 2003
Type: inproceedings
Reference: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1250783&userType=inst
