Title：A heuristic approach to detecting transition faults at all circuit outputs
Authors: Tsuyoshi Iwagaki, Mineo Kaneko
Jounrnals：Proc. IEICE Society Conference
Pages: 54
Published Month: 9
Published Year: 2009
Type: techreport
Title：A heuristic approach to detecting transition faults at all circuit outputs
Authors: Tsuyoshi Iwagaki, Mineo Kaneko
Jounrnals：Proc. IEICE Society Conference
Pages: 54
Published Month: 9
Published Year: 2009
Type: techreport
