Title：An approach to power-constrained test generation for scan circuits
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake
Jounrnals：IEICE Technical Report (FIIS-07-218)
Pages: 1-6
Published Month: 10
Published Year: 2007
Type: techreport
Title：An approach to power-constrained test generation for scan circuits
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake
Jounrnals：IEICE Technical Report (FIIS-07-218)
Pages: 1-6
Published Month: 10
Published Year: 2007
Type: techreport
