Title：Analysis of fault coverage under a power budget in scan testing
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake
Jounrnals：Proc. IEICE Society Conference
Pages: 53
Published Month: 9
Published Year: 2007
Type: techreport
Title：Analysis of fault coverage under a power budget in scan testing
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake
Jounrnals：Proc. IEICE Society Conference
Pages: 53
Published Month: 9
Published Year: 2007
Type: techreport
