タイトル：A test generation framework using checker circuits and its application to path delay test generation
著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Mineo Kaneko, Hideo Fujiwara
雑誌名：IEICE Technical Report (CAS2006-76)
Volume: 106
Number: 512
ページ: 37-42
発行月: 1
発行年: 2007
タイプ: techreport
