Title：A broadside test generation method for transition faults in partial scan circuits
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：IEICE Technical Report (DC2005-54)
Volume: 105
Number: 443
Pages: 7-12
Published Month: 12
Published Year: 2005
Type: techreport
