Title：Equivalence of sequential transition test generation and constrained combinational stuck-at test generation
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：IEICE Technical Report (DC2004-96)
Volume: 104
Number: 664
Pages: 27-32
Published Month: 2
Published Year: 2005
Type: techreport
