Title：Test Generation Using Boolean Satisfiability Based on Instance Similarity
Authors: Fumiyuki Hafuri, Kenji Ueda, Toshiya Mukai, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：13th IEEE Hiroshima Student Symposium
Pages: 373-376
Published Month: 11
Published Year: 2011
Type: techreport
