タイトル：An approach to hardware SAT solvers for test generation based on instance similarity
著者: Tsuyoshi Iwagaki, Fumiyuki Hafuri, Kenji Ueda, Toshiya Mukai, Hideyuki Ichihara, Tomoo Inoue
雑誌名：12th IEEE Workshop on RTL and High Level Testing
ページ: 69-74
発行月: 11
発行年: 2011
タイプ: inproceedings
