Title：An approach to hardware SAT solvers for test generation based on instance similarity
Authors: Tsuyoshi Iwagaki, Fumiyuki Hafuri, Kenji Ueda, Toshiya Mukai, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：12th IEEE Workshop on RTL and High Level Testing
Pages: 69-74
Published Month: 11
Published Year: 2011
Type: inproceedings
