タイトル:A Study on Error Correctable Test Pattern Generator for Reliable Built-in Self Test

著者: Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue

雑誌名:Workshop on RTL and High Level Testing

発行月: 11

発行年: 2012

タイプ: inproceedings