Title：A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test
Authors: Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：Tech. Report of IEICE
Volume: 112
Number: 102
Pages: 15-20
Published Month: 6
Published Year: 2012
Type: techreport
