Title：A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability
Authors: Masaaki Sakurada, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：Tech. Report of IEICE
Volume: 112
Number: 362
Pages: 21-26
Published Month: 12
Published Year: 2012
Type: techreport
