タイトル：A System-Error-Rate-Oriented Approach to Test Generation for Effective Yield Maximization
著者: Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue
雑誌名：IEEE International Workshop on Reliability Aware System Design and Test
発行月: 1
発行年: 2014
タイプ: inproceedings
