タイトル:A System-Error-Rate-Oriented Approach to Test Generation for Effective Yield Maximization

著者: Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue

雑誌名:IEEE International Workshop on Reliability Aware System Design and Test

発行月: 1

発行年: 2014

タイプ: inproceedings

リファレンス: http://vlsidesignconference.org/schedule.html#ras1