Title：A System-Error-Rate-Oriented Approach to Test Generation for Effective Yield Maximization
Authors: Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue
Jounrnals：IEEE International Workshop on Reliability Aware System Design and Test
Published Month: 1
Published Year: 2014
Type: inproceedings
Reference: http://vlsidesignconference.org/schedule.html#ras1
