タイトル：A practical approach for logic simplification based on fault acceptability for error tolerant application
著者: Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue
雑誌名：Proc. 20th IEEE European Test Symposium (ETS '15)
発行月: 5
発行年: 2015
タイプ: inproceedings
