Title:A practical approach for logic simplification based on fault acceptability for error tolerant application

Authors: Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue

Jounrnals:Proc. 20th IEEE European Test Symposium (ETS '15)

Published Month: 5

Published Year: 2015

Type: inproceedings