Title:A practical approach for logic simplification based on fault acceptability for error tolerant application
Authors: Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue
Jounrnals:Proc. 20th IEEE European Test Symposium (ETS '15)
Published Month: 5
Published Year: 2015
Type: inproceedings