タイトル:A Prototype of a Hardware SAT Solver for Similar Large Instances and Its Application to Test Generation

著者: Tsuyoshi Iwagaki, Syoichi Ohmoto, Hideyuki Ichihara, Tomoo Inoue

雑誌名:Digest of Papers 16th IEEE Workshop on RTL and High Level Testing (WRTLT '15)

発行月: 11

発行年: 2015

タイプ: inproceedings