タイトル：A Prototype of a Hardware SAT Solver for Similar Large Instances and Its Application to Test Generation
著者: Tsuyoshi Iwagaki, Syoichi Ohmoto, Hideyuki Ichihara, Tomoo Inoue
雑誌名：Digest of Papers 16th IEEE Workshop on RTL and High Level Testing (WRTLT '15)
発行月: 11
発行年: 2015
タイプ: inproceedings
