Title：Exploration of Four-Phase Dual-Rail Asynchronous RTL Design for Delay-Robustness
Authors: Tsuyoshi Iwagaki, Kohta Itani, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：Digest of Papers 17th IEEE Workshop on RTL and High Level Testing
Published Month: 11
Published Year: 2016
Type: inproceedings
