タイトル：Experimental evaluation of test cost reduction by scan chain testing in RTL scan circuits
著者: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
雑誌名：Digest of Papers 18th IEEE Workshop on RTL and High Level Testing (WRTLT '17)
ページ: 1-6
発行月: 11
発行年: 2017
タイプ: inproceedings
