Title：Experimental evaluation of test cost reduction by scan chain testing in RTL scan circuits
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：Digest of Papers 18th IEEE Workshop on RTL and High Level Testing (WRTLT '17)
Pages: 1-6
Published Month: 11
Published Year: 2017
Type: inproceedings
