Title：Detection of faults on functional paths in RTL scan circuits by scan chain testing
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FIIS-17-461
Pages: 1-4
Published Month: 10
Published Year: 2017
Type: techreport
Title：Detection of faults on functional paths in RTL scan circuits by scan chain testing
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FIIS-17-461
Pages: 1-4
Published Month: 10
Published Year: 2017
Type: techreport
