タイトル：State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
著者: Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue
雑誌名：IEEE Proc. of International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
発行月: 10
発行年: 2019
タイプ: inproceedings
