Title：State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Authors: Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue
Jounrnals：IEEE Proc. of International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Published Month: 10
Published Year: 2019
Type: inproceedings
