タイトル:An empirical approach to RTL scan path design focusing on structural interpretation in logic synthesis
著者: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
雑誌名:Proc. 3rd IEEE International Test Conference in Asia (ITC-Asia '19)
ページ: 55-60
発行月: 9
発行年: 2019
タイプ: inproceedings