タイトル:An empirical approach to RTL scan path design focusing on structural interpretation in logic synthesis

著者: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue

雑誌名:Proc. 3rd IEEE International Test Conference in Asia (ITC-Asia '19)

ページ: 55-60

発行月: 9

発行年: 2019

タイプ: inproceedings