Title:An empirical approach to RTL scan path design focusing on structural interpretation in logic synthesis
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals:Proc. 3rd IEEE International Test Conference in Asia (ITC-Asia '19)
Pages: 55-60
Published Month: 9
Published Year: 2019
Type: inproceedings