Title:An empirical approach to RTL scan path design focusing on structural interpretation in logic synthesis

Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue

Jounrnals:Proc. 3rd IEEE International Test Conference in Asia (ITC-Asia '19)

Pages: 55-60

Published Month: 9

Published Year: 2019

Type: inproceedings