Title：Defect and Test Technology of Integrated Circuits
Authors: Tomoo Inoue
Jounrnals：The Journal of Institute of Electronics, Information and Communication Engineers, Vol. 103, No. 1
Pages: 62-67
Published Month: 1
Published Year: 2020
Type: survey
Reference: https://www.journal.ieice.org/archive.php?vol=103&num=1&year=2020&lang=J
