Title：A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers

Authors: Qiling Wang, Hideyuki Ichihara, Tomoo Inoue

Jounrnals：IEICE Tech. Repo.

Pages: 17-22

Published Month: 2

Published Year: 2024

Type: techreport

Reference: https://ken.ieice.org/ken/paper/20240228NcBN/

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