Title:On Fault Detectability by Scan Chain Testing in RTL Scan Design
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals:FTC Technical Report
Published Month: 1
Published Year: 2018
Type: techreport
Title:On Fault Detectability by Scan Chain Testing in RTL Scan Design
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals:FTC Technical Report
Published Month: 1
Published Year: 2018
Type: techreport