Title：On Fault Detectability by Scan Chain Testing in RTL Scan Design
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FTC Technical Report
Published Month: 1
Published Year: 2018
Type: techreport
Title：On Fault Detectability by Scan Chain Testing in RTL Scan Design
Authors: Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FTC Technical Report
Published Month: 1
Published Year: 2018
Type: techreport
