Title：Test sequence compaction methods for acyclic sequential circuits using a time expansion model
Authors: Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara
Jounrnals：Trans. of IEICE (DI)
Volume: J82-D-I
Number: 7
Pages: 869-878
Published Month: 7
Published Year: 1999
Type: article
Abstract:
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