Title：Static and dynamic test sequence compaction methods for acyclic sequential circuits using a time exp
Authors: Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara
Jounrnals：Proc. 8th IEEE Asian Test Symp.
Pages: 192-199
Published Month: 11
Published Year: 1999
Type: inproceedings
Abstract:
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