Title：Experimental Considerations on the Reduction in Self-Test Data for Stochastic Computing Circuits
Authors: Akira Matsumoto, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FIIS Tech. Repo.
Published Month: 3
Published Year: 2025
Type: techreport
Title：Experimental Considerations on the Reduction in Self-Test Data for Stochastic Computing Circuits
Authors: Akira Matsumoto, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：FIIS Tech. Repo.
Published Month: 3
Published Year: 2025
Type: techreport
