Title：Experimental analysis of Built-In Self-Test for Stochastic Computing Circuits

Authors: Akira Matsumoto, Hideyuki Ichihara, Tomoo Inoue

Jounrnals：IEICE Tech. Repo.

Pages: 31-36

Published Month: 2

Published Year: 2026

Type: techreport

Reference: https://ken.ieice.org/ken/paper/20260217pcri/

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