タイトル：An Extended Class of Acyclically Testable Circuits
著者: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
雑誌名：Dig. of Papers of 8th Workshop on RTL and High-Level Testing (WRTLT'07)
発行月: 10
発行年: 2007
タイプ: inproceedings
タイトル：An Extended Class of Acyclically Testable Circuits
著者: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
雑誌名：Dig. of Papers of 8th Workshop on RTL and High-Level Testing (WRTLT'07)
発行月: 10
発行年: 2007
タイプ: inproceedings
