タイトル:A new test generation model for broadside transition testing of partial scan circuits

著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara

雑誌名:Proc. 14th IFIP/IEEE/ACM International Conference on Very Large Scale Integration (VLSI-SoC '06)

ページ: 308-313

発行月: 10

発行年: 2006

タイプ: inproceedings

リファレンス: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04107648