タイトル：A new test generation model for broadside transition testing of partial scan circuits
著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
雑誌名：Proc. 14th IFIP/IEEE/ACM International Conference on Very Large Scale Integration (VLSI-SoC '06)
ページ: 308-313
発行月: 10
発行年: 2006
タイプ: inproceedings
リファレンス: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04107648
