タイトル：Equivalence of sequential transition test generation and constrained combinational stuck-at test generation
著者: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
雑誌名：IEICE Technical Report (DC2004-96)
Volume: 104
Number: 664
ページ: 27-32
発行月: 2
発行年: 2005
タイプ: techreport
